GW Instek MSO-2102EA 100 MHz, 2-Ch. Digital Storage Oscilloscope
100 MHz bandwidth
Equipped with a 16-Channel Logic Analyzer and a dual channel 25 MHz arbitrary waveform generator
Real time sample rate for each channel is 1GSa/s
Free Frequency Response Analyzer Software (Download from manufacture website only)
Maximum 10M memory depth and VPO waveform display technology
Waveform update rate up to 120,000 wfms/s
8" WVGA TFT LCD screen display
Maximum 1M FFT provides higher frequency domain resolution measurements
High Pass, Low Pass and Band Pass Filter Functions
29,000 segmented memory sections and waveform search function
I2C/SPI/UART/CAN/LIN serial bus trigger and decoding functions
Data log function is able to track signal changes up to 100 hours
Network storage function
Analog technique that determines the performance height of an oscilloscope
Although the oscilloscope is not instrument on the top of the hardware requirements, given the oscilloscope is the most familiar with many engineers is one of the biggest single instrument of test equipment market segment, so we interviewed in the world to do the oscilloscope bandwidth GHz level several representative, from the analysis on the oscilloscope hardware, with everyone together to understand the core of the oscilloscope design unit.
Bandwidth, sampling rate and storage depth, is the most intuitive decision an oscilloscope market value of the three features, including bandwidth can reflect the performance of the oscilloscope is the most obvious indicators, sampling rate values and bandwidth have been linked, while the two numerical oscilloscope is directly related to the final price, its value is basic it is decided by simulation unit of hardware performance.
High precision dither test of digital oscilloscope
Jitter can be described as the periodic change of edge period or phase of adjacent pulse edge or even non-adjacent pulse edge. These indicators are suitable for measuring long-term and short-term clock and data stability.The data transmission performance of complex system is predicted by analyzing the jitter index and using the jitter test results.
Periodic jitter is used to measure edge - to - edge timing of clock or data cycle samples. For example, by measuring the time between the rising edges of 1,000 clock cycles, you can sample the statistical cycles that will tell you the quality of the signal.The standard deviation becomes RMS periodic jitter, the maximum period minus the minimum period, to get peak to peak period jitter.The precision of each measurement period determines the precision of jitter measurement.
Phase jitter is used to measure the time deviation between the edge of the measured signal and the edge of a reference signal so that any change in the signal phase can be detected.This indicator is different from periodic measurement in many ways. First, it USES each edge alone, without saying "period" or "cycle."Second, it can measure large time shifts.The edge phase can be deviated by hundreds or thousands of degrees, but can still be measured with very high precision (360 degrees equals one cycle or cycle time). The commonly used measure of phase error is the time interval error (TIE), and the measurement results are expressed in seconds relative to degrees.TIE matches the signal edges to the reference edges, and sums up the differences between the edges.After comparing a large number of edges, a sample set can be provided for analysis.As with the above periodic measurements, the standard deviation becomes RMS TIE, the maximum time minus the minimum time to get peak to peak TIE and so on.